QDL Tech Corner: JEOL NeoScope Scanning Electron Microscope | Quality Digest

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QDL Tech Corner: JEOL NeoScope Scanning Electron Microscope

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Story links for Sept. 20, 2019

This is not your father's SEM

This week on Tech Corner we look at the JEOL NeoScope (JCM-7000) scanning electron microscope from Nikon Metrology. Auto functions, stage automation, and software enable easy sample imaging and elemental analysis.