CMSC Call for Papers Attracts Metrology Experts Sharing Best Practices

Published: Tuesday, February 21, 2012 - 10:23

When it comes to metrology, particularly as it applies to portable 3-D applications, no organization is more committed to this discipline than the Coordinate Metrology Society (CMS). Each year, the CMS welcomes abstracts for presentations and technical papers for its annual Coordinate Metrology Systems Conference (CMSC). The CMS heads to New Orleans for its 28th annual event from July 16–20, 2012. And if New Orleans isn’t enough enticement, a wealth of technical information and best practices will be covered by metrology professionals from leading manufacturers, science laboratories, and academia.

The deadline for submitting abstracts is March 1, 2012, which will be followed by the notification of acceptance on March 15, 2012. For guidelines or more information about presenting a technical paper at CMSC 2012, contact Michael Raphael, CMSC technical presentations coordinator, at presentations@cmsc.org. Abstract submissions are peer-reviewed by the CMS and considered for presentation at CMSC 2012. Guidelines for presentations and technical papers can be downloaded at 2012 CMSC Guidelines. The CMS Executive Committee will also review all technical papers presented at the CMSC, and select the conference’s best papers for publication in The Journal of the CMSC.

Suggested topics for CMSC technical papers include industry best practices, scientific research and developments, and successful applications of 3-D coordinate measurement systems. The CMSC is the only North American conference dedicated solely to users of portable, high-precision measurement technology used to inspect manufactured and assembled components on the factory floor.

At last year’s conference, 26 expert presentations were delivered by industry leaders from The Boeing Co., Mann+Hummel USA, Rolls-Royce North America, Sigma Space, Northrop Grumman Aerospace Systems, NIST, Lawrence Livermore National Lab, National Physical Laboratory (NPL), University of Ontario Institute of Technology, University of Arizona, Coventry University (UK), and other organizations covering technology, theory, and practice to advance the field of 3-D metrology. Topics included aerospace and automotive metrology applications, reducing plastic injection tool-tuning iterations with scanning technology, measuring with computed tomography, measurement strategies in industrial robot applications, reducing engineering time for compensation of large CNC machines, and much more.

About The Author

Belinda Jones

Belinda Jones is the founder and owner of HiTech Marketing LLC, in Westbrook, Connecticut. For more than a decade, Jones has written articles and commentaries about manufacturing, engineering, quality assurance, CAD/CAM/CAE applications, and other high-tech topics. She has extensive experience in marketing communications, technical sales, and applications engineering. Before joining the computer industry, she was a broadcast copywriter for four years. Jones holds degrees in fine arts and mechanical engineering, and studied cultural arts in Europe.