Six Sigma Features

Mark Rosenthal's picture
Mark Rosenthal
Continuing on the theme of value stream mapping (and process mapping in general) from my article “Where is your value stream map?”, I outlined the typical scenario: The map is built by the continuous...
Scott A. Hindle's picture
Scott A. Hindle
So far in this series our focus has remained on statistical process control (SPC) in manufacturing. We’ve alternated between more traditional uses of SPC that remain relevant in this digital era and...
Adam Grant's picture
Adam Grant
Nano Tools for Leaders—a collaboration between Wharton Executive Education and Wharton’s Center for Leadership and Change Management—are fast, effective tools that you can learn and start using in...
Scott A. Hindle's picture
Scott A. Hindle
You are assigned a new task to demonstrate that an existing process will have the capability to meet newer and tighter specifications. The change in specifications for critical-to-quality...
Douglas C. Fair's picture
Douglas C. Fair
Just a few decades ago, today’s personal technology was a science fiction pipe dream. Powerful computers (smart phones) that fit in our pockets; global positioning satellites for our traveling...
Scott A. Hindle's picture
Scott A. Hindle
Parts 1, 2, and 3 of our series on statistical process control (SPC) have shown how data can be thoughtfully used to enable learning and improvement—and consequently, better product quality and lower...
Donald J. Wheeler's picture
Donald J. Wheeler
Fourteen years ago, I published “Do You Have Leptokurtophobia?” Based on the reaction to that column, the message was needed. In this column, I would like to explain the symptoms of leptokurtophobia...
Douglas C. Fair's picture
Douglas C. Fair
Data overload has become a common malady. Modern data collection technologies and low-cost database storage have motivated companies to collect data on almost everything. The result? Data overload....
Scott A. Hindle's picture
Scott A. Hindle
We are one year away from the 100th anniversary of the creation of the control chart: Walter Shewhart created the control chart in 1924 as an aid to Western Electric’s manufacturing operations. Since...
Donald J. Wheeler's picture
Donald J. Wheeler
In last month’s column, we looked at how process-hyphen-control algorithms work with a process that is subject to occasional upsets. This column will consider how they work with a well-behaved...
Douglas C. Fair's picture
Douglas C. Fair
Today’s manufacturing systems have become more automated, data-driven, and sophisticated than ever before. Visit any modern shop floor and you’ll find a plethora of IT systems, HMIs, PLC data streams...
Donald J. Wheeler's picture
Donald J. Wheeler
Many articles and some textbooks describe process behavior charts as a manual technique for keeping a process on target. For example, in Norway the words used for SPC (statistical process control)...
William A. Levinson's picture
William A. Levinson
Inflation is a serious national issue. Credit agency Fitch Ratings just downgraded the U.S. credit rating—as in the “full faith and credit of the United States”—from AAA to AA+.1 This doubtlessly...
Donald J. Wheeler's picture
Donald J. Wheeler
As we learned last month, the precision to tolerance ratio is a trigonometric function multiplied by a scalar constant. This means that it should never be interpreted as a proportion or percentage....
Donald J. Wheeler's picture
Donald J. Wheeler
The keys to effective process behavior charts are rational sampling and rational subgrouping. As implied by the word rational, we must use our knowledge of the context to collect and organize data in...
Paul Laughlin's picture
Paul Laughlin
Continuing our thinking about ways for data leaders to save money during a recession, this article drills into saving on your data usage. Following my last post reminiscing on the lessons I learned...
Donald J. Wheeler's picture
Donald J. Wheeler
As the foundations of modern science were being laid, the need for a model for the uncertainty in a measurement became apparent. Here we look at the development of the theory of measurement error and...
Donald J. Wheeler's picture
Donald J. Wheeler
In memory of Al Phadt, Ph.D. This article is a reprint of a paper Al and I presented several years ago. It illustrates how the interpretation and visual display of data in their context can...
Alan Metzel's picture
Alan Metzel
Almost seven years ago, Quality Digest presented a short article by Matthew Barsalou titled “A Worksheet for Ishikawa Diagrams.” At the time, I commented concerning enhancements that provide...
Donald J. Wheeler's picture
Donald J. Wheeler
The computation for skewness does not fully describe everything that happens as a distribution becomes more skewed. Here we shall use some examples to visualize just what skewness does—and does not—...